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7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California

ACM Digital Library Available online

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Format:
Book
Conference/Event
Author/Creator:
International Symposium on Quality Electronic Design, Corporate Author.
Contributor:
IEEE Electron Devices Society, Content Provider.
Components, Packaging & Manufacturing Technology Society, Content Provider.
IEEE Circuits and Systems Society, Content Provider.
Conference Name:
International Symposium on Quality Electronic Design (7th : 2006 : San Jose, Calif.)
Series:
ACM Conferences.
Language:
English
Subjects (All):
Integrated circuits--Reliability--Very large scale integration--Congresses.
Integrated circuits.
Integrated circuits--Very large scale integration--Design and construction--Congresses.
Integrated circuits--Computer-aided design--Very large scale integration--Congresses.
Integrated circuits--Testing--Quality control--Very large scale integration--Congresses.
Other Title:
ISQED '06
Place of Publication:
[Place of publication not identified] : IEEE Computer Society, 2006.
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
9781509094592
1509094598

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