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2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Corporate Author.
- Conference Name:
- International Conference on Design & Test of Integrated Systems in Nanoscale Technology (1st : 2006 : Tunis, Tunisia)
- International Conference on Design & Test of Integrated Systems in Nanoscale Technology.
- Language:
- English
- Subjects (All):
- Integrated circuits--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Nanotechnology--Design--Congresses.
- Nanotechnology.
- Microelectronics--Congresses.
- Microelectronics.
- Place of Publication:
- [Place of publication not identified] Institute of Electrical and Electronics Engineers 2006
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509095483
- 1509095489
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