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2006 IEEE International Conference on Microelectronic Test Structures
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Physical Description:
- 1 online resource (xiii, 229 pages) : illustrations
- Place of Publication:
- [Place of publication not identified] I E E E 2006
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781509092949
- 1509092943
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