DFT 2005: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (03-05 October 2005/Monterey, CA)

Format:

Book

Author/Creator:

Aitken, Robert, author.

Language:

English

Subjects (All):

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Physical Description:

1 online resource (xii, 602 pages) : illustrations

Place of Publication:

[Place of publication not identified] IEEE Computer Society Press 2005

Language Note:

English

Summary:

Annotation DFT 2005 showcases the latest research results on yield analysis and modeling, scan design and test data compression, reconfiguration, error correcting codes and circuits, and fault detection and tolerance for sensor and flash memory. Its also covers delay fault test and timing consideration, interconnect test, approaches for soft error, on-line and concurrent fault detection, fault and error tolerant systems, and test scheduling and software-based test.

Notes:

Bibliographic Level Mode of Issuance: Monograph

ISBN:

9781538602904

1538602903