1 option
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Symposium on Quality Electronic Design, Corporate Author.
- Conference Name:
- International Symposium on Quality Electronic Design (6th : 2005 : San Jose, Calif.)
- International Symposium on Quality Electronic Design
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Very large scale integration--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits--Very large scale integration--Computer-aided design--Congresses.
- Integrated circuits--Very large scale integration--Testing--Quality control--Congresses.
- Other Title:
- Quality of Electronic Design, 2005, ISQED 2005, Sixth International Symposium on.
- Place of Publication:
- [Place of publication not identified] IEEE Computer Society 2005
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 9781538600672
- 1538600676
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.