My Account Log in

1 option

Proceedings ED&TC European Design and Test Conference / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

IEEE Xplore (IEEE/IET Electronic Library - IEL)
Format:
Book
Language:
English
Subjects (All):
Computer-aided design--Congresses.
Integrated circuits--Testing--Congresses.
Physical Description:
1 online resource : illustrations
Contained In:
Design Automation, European Conference on 2377-6323
Place of Publication:
Los Alamitos, California : IEEE, 1996.
Notes:
Description based on publisher supplied metadata and other sources.
Includes bibliographical references.

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

We want your feedback!

Thanks for using the Penn Libraries new search tool. We encourage you to submit feedback as we continue to improve the site.

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Library Catalog Using Articles+ Library Account