1 option
DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Current & Defect Based Testing (2005 : Palm Springs, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Iddq testing--Congresses.
- Iddq testing.
- Metal oxide semiconductors, Complementary--Congresses.
- Metal oxide semiconductors, Complementary.
- Physical Description:
- 1 online resource (81 pages)
- Place of Publication:
- New York : IEEE, 2005.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed March 28, 2018).
- ISBN:
- 1-5386-0065-X
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