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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007.

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Format:
Book
Conference/Event
Contributor:
Baczmański, A., Contributor.
Fais, A., Contributor.
Mahajan, A., Contributor.
Tidu, A., Contributor.
Larson, B. C., Contributor.
Red'kin, B. N., Contributor.
Helm, C., Contributor.
Genzel, Ch., Contributor.
Wüstefeld, Ch., Contributor.
He, D., Contributor.
Heger, D., Contributor.
Dewindara Kaura, Contributor.
Pathak, Dinesh, Contributor.
Rafaja, D., Contributor.
Dīpaka, Contributor.
Kudrenko, E. A., Contributor.
Ponyatovsky, E. G., Contributor.
Mittemeijer, E. J., Contributor.
Borca, E., Contributor.
Cotoi, E., Contributor.
Filatov, E., Contributor.
Kroke, E., Contributor.
Strukova, G. K., Contributor.
Schreiber, G., Contributor.
Curtius, H., Contributor.
Holzschuh, H., Contributor.
Pesenti, H., Contributor.
Wulff, H., Contributor.
Shmytko, I. M., Contributor.
Shmyt'ko, I. M., Contributor.
Tomov, I., Contributor.
Zizak, I., Contributor.
Robinson, I. K. (Ian K.), 1955- Contributor.
Francis, J. A., Contributor.
Wang, J. Y., Contributor.
Tischler, J. Z., Contributor.
Bergmann, J., Contributor.
Drahokoupil, J., Contributor.
Musil, J., Contributor.
Čížek, J., Contributor.
Šícha, J., Contributor.
Saanouni, K., Contributor.
Ufer, K., Contributor.
Wierzbanowski, K., Contributor.
Levine, L. E., Contributor.
Nichtová, L., Contributor.
Kassner, M. E., Contributor.
Stoudt, M. R., Contributor.
Bercu, M., Contributor.
Birkholz, M., Contributor.
Dopita, M., Contributor.
François, M., Contributor.
Griffiths, M., Contributor.
Janeček, M., Contributor.
Klaus, M., Contributor.
Leoni, M., Contributor.
Motylenko, M., Contributor.
Quaas, M., Contributor.
Růžička, M., Contributor.
Schwarz, M., Contributor.
Sharafutdinov, M., Contributor.
Stranyánek, M., Contributor.
Turski, M., Contributor.
Wohlschlögel, M., Contributor.
Čerčanský, M., Contributor.
Čerňanský, M., Contributor.
Mittemeijer, Contributor.
Klassen, N. V., Contributor.
Darowski, N., Contributor.
Ganev, N., Contributor.
Hfaiedh, N., Contributor.
Kaura, Ainna., Contributor.
Ivanova, O., Contributor.
Tōmas, Ō., Contributor.
Withers, P. J., Contributor.
Boháč, P., Contributor.
Geantil, P., Contributor.
Lipinski, P., Contributor.
Scardi, P., Contributor.
Bedi, R. K., Contributor.
Dohrmann, R., Contributor.
Kleeberg, R., Contributor.
Kužel, R., Contributor.
Čtvrtlík, R., Contributor.
Brar, S. S., Contributor.
Cherepanova, S. V., Contributor.
Tsybulya, S. V., Contributor.
Georgescu, S., Contributor.
Hodorogea, S., Contributor.
Kumar, S., Contributor.
Vassilev, S., Contributor.
Barsukova, T., Contributor.
Welzel, U., Contributor.
Zlokazov, V. B., Contributor.
Kedrov, V. V., Contributor.
Sinitsyn, V. V., Contributor.
Cherkaska, V., Contributor.
Klemm, V., Contributor.
Liu, W., Contributor.
Kuru, Y., Contributor.
Shubin, Yu., Contributor.
Matěj, Z., Contributor.
Conference Name:
Size-Strain Conference (5th : 2007 : Garmisch-Partenkirchen, Germany)
Series:
Zeitschrift für Kristallographie. Supplement issue ; Number 27.
Zeitschrift für Kristallographie / Supplemente ; 27
Language:
English
Subjects (All):
Cosmic physics.
Geophysics.
Physical Description:
1 online resource (xii, 305 pages) : illustrations.
Edition:
1st ed.
Place of Publication:
Berlin ; Boston : Oldenbourg Wissenschaftsverlag, [2015]
Language Note:
English
System Details:
text file
Summary:
Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Contents:
Frontmatter
PREFACE
Table of Contents
PLANAR FAULTING
Diffraction analysis of layer disorder / Leoni, M.
Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering / Cherepanova, S. V. / Tsybulya, S. V.
NANOCRYSTALLINE MATERIALS
Interference phenomena in nanocrystalline materials and their application in the microstructure analysis / Rafaja, D. / Klemm, V. / Wüstefeld, Ch. / Motylenko, M. / Dopita, M. / Schwarz, M. / Barsukova, T. / Kroke, E.
Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources / Robinson, Ian K.
Capacitor discharge sintering of nanocrystalline copper / Fais, A. / Scardi, P.
Microstructure study on BN nanocomposites using XRD and HRTEM / Motylenko, M. / Klemm, V. / Schreiber, G. / Rafaja, D. / Schwarz, M. / Barsukova, T. / Kroke, E.
PLASTIC DEFORMATION
Impact of dislocation cell elastic strain variations on line profiles from deformed copper / Levine, L. E. / Larson, B. C. / Tischler, J. Z. / Geantil, P. / Kassner, M. E. / Liu, W. / Stoudt, M. R.
Determination of stored elastic energy in plastically deformed copper / Baczmański, A. / Hfaiedh, N. / François, M. / Saanouni, K. / Wierzbanowski, K.
Structural studies of submicrocrystalline copper and copper composites by different methods / Kužel, R. / Cherkaska, V. / Matěj, Z. / Janeček, M. / Čížek, J. / Dopita, M.
Grain stresses and elastic energy in ferritic steel under uniaxial load / Baczmański, A. / Tidu, A. / Lipinski, P. / Wierzbanowski, K.
Stress and hardness in surface layers of shot-peened steels / Drahokoupil, J. / Ganev, N. / Čerňanský, M. / Boháč, P. / Čtvrtlík, R. / Stranyánek, M.
LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN
The "state of the art" of the diffraction analysis of crystallite size and lattice strain / Mittemeijer, E. J. / Welzel, U.
Recent advancements in Whole Powder Pattern Modelling / Scardi, P.
On the simulation of the anisotropic peak broadening in powder diffraction / Zlokazov, V. B.
XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process / Borca, E. / Bercu, M. / Georgescu, S. / Hodorogea, S. / Cotoi, E.
Cumulants and moments in the line profile analysis / Čerčanský, M.
X-ray line-broadening analysis of dislocations in a single crystal of Zr / Griffiths, M.
XRD line profile analysis of calcite powders produced by high energy milling / Pesenti, H. / Leoni, M. / Scardi, P.
Refining real structure parameters of disordered layer structures within the Rietveld method / Ufer, K. / Kleeberg, R. / Bergmann, J. / Curtius, H. / Dohrmann, R.
Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation / Wüstefeld, Ch. / Dopita, M. / Klemm, V. / Heger, D. / Rafaja, D.
MATERIALS MICROSTRUCTURE
Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films / Bedi, R. K. / Brar, S. S. / Kaur, N. / Kumar, S. / Mahajan, A.
Structural and optical properties of AgInSe2 films / Bedi, R. K. / Pathak, D. / Deepak / Kaur, D.
In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor / Filatov, E. / Shubin, Yu. / Sharafutdinov, M.
Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium / He, D. / Wang, J. Y. / Mittemeijer
Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments / Kudrenko, E. A. / Shmyt'ko, I. M. / Sinitsyn, V. V. / Ponyatovsky, E. G. / Red'kin, B. N.
Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods / Shmytko, I. M. / Kudrenko, E. A. / Strukova, G. K. / Kedrov, V. V. / Klassen, N. V.
Refinement of extinction-affected X-ray reflection profile of textures / Tomov, I. / Vassilev, S.
STRESSES AND STRAINS
Diffraction analysis of elastic strains in micro- and nanostructures / Thomas, O.
Determination of residual stress at weld interruptions by neutron diffraction / Turski, M. / Francis, J. A. / Withers, P. J.
Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation / Dopita, M. / Wüstefeld, Ch. / Klemm, V. / Schreiber, G. / Heger, D. / Růžička, M. / Rafaja, D.
In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants / Kuru, Y. / Wohlschlögel, M. / Welzel, U. / Mittemeijer, E. J.
THIN FILMS
Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction / Birkholz, M. / Darowski, N. / Zizak, I.
X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry / Klaus, M. / Genzel, Ch. / Holzschuh, H.
Magnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition / Kužel, R. / Nichtová, L. / Matěj, Z. / Šícha, J. / Musil, J.
Influence of reactive plasmas on thin nickel films / Quaas, M. / Ivanova, O. / Helm, C. A. / Wulff, H.
Author Index
Notes:
Bibliographic Level Mode of Issuance: Monograph
Includes bibliographical references.
This eBook is made available Open Access. Unless otherwise specified individually in the content, the work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives (CC BY-NC-ND) license: https://creativecommons.org/licenses/by-nc-nd/3.0 https://www.degruyter.com/dg/page/open-access-policy
Description based on online resource; title from PDF title page (publisher's Web site, viewed 15. Jun 2019)
ISBN:
3-486-99256-2
OCLC:
979739024

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