Microwave impedance microscopy of nanostructured carbon / Timothy S. Jones.

Format:

Book

Manuscript

Thesis/Dissertation

Author/Creator:

Jones, Timothy S., author.

Contributor:

Santiago-Aviles, Jorge J., degree supervisor.

Aflatouni, Firooz, degree committee member.

Gogotsi, Yury, 1961- degree committee member.

Spiegel, Jan Van Der, degree committee member.

University of Pennsylvania. Department of Electrical and Systems Engineering, degree granting institution.

Language:

English

Subjects (All):

Penn dissertations--Electrical and Systems Engineering.

Electrical and Systems Engineering--Penn dissertations.

Local Subjects:

Penn dissertations--Electrical and Systems Engineering.

Electrical and Systems Engineering--Penn dissertations.

Physical Description:

xi, 126 leaves : illustrations ; 29 cm

Production:

[Philadelphia, Pennsylvania] : University of Pennsylvania, 2016.

Summary:

Microwave impedance microscopy (MIM) is a scanning probe technique that measures local changes in tip-sample admittance. The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ?Y is given a reference value in siemens. Simulations also provide a means of extracting sample conductivity and permittivity from admittance, a procedure verified by comparing the estimated permittivity of polytetrafluoroethlyene (PTFE) to the accepted value. Finally, the well-known effective medium approximation of Bruggeman is considered as a means of estimating the volume fractions of the constituents in inhomogeneous two-phase systems. Specifically, we consider the estimation of porosity in nanostructured carbons often used in charge storage devices, such as carbide derived carbon (CDC) and onion-like carbon (OLC).

Notes:

Ph. D. University of Pennsylvania 2016.

Department: Electrical and Systems Engineering.

Supervisor: Jorge J. Santiago-Aviles.

Includes bibliographical references.

OCLC:

1138088614