Quantum metrology, imaging, and communication / David S. Simon, Gregg Jaeger, Alexander V. Sergienko.

Format:

Book

Author/Creator:

Simon, David S., author.

Jaeger, Gregg, author.

Sergienko, Alexander V., author.

Series:

Quantum science and technology

Quantum science and technology, 2364-9054

Language:

English

Subjects (All):

Quantum theory.

Quantum computing.

Physical Description:

xii, 273 pages : illustrations (some color) ; 24 cm.

Place of Publication:

Cham, Switzerland : Springer, [2017]

Summary:

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Contents:

Quantum Optics and Entanglement

Two-Photon Interference- Aberration and Dispersion Cancelation

Quantum Metrology

Polarization Mode Dispersion

Ghost Imaging and Related Topics

Quantum Microscopy

Correlated and Entangled Orbital Angular Momentum

Quantum Communication and Cryptography

Appendices A: Review of Optics

B: Optical Fields in Quantum Mechanics

C: Optical Effects of Aberration and Turbulence

D: Phase Matching in Spontaneous Parametric Down Conversion

E: Vectorial Scattering Analysis of the Twin-Photon Microscope.

Notes:

Includes bibliographic references and index.

ISBN:

331946549X

9783319465494

OCLC:

957133618