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Low voltage electron microscopy : principles and applications / edited by David C. Bell and Natasha Erdman.
- Format:
- Book
- Series:
- RMS-Wiley series
- Royal Microscopical Society-John Wiley series
- Language:
- English
- Subjects (All):
- Electron microscopy--Technique.
- Electron microscopy.
- Physical Description:
- 1 online resource (xiii, 203 pages), 14 unnumbered pages) of plates : illustrations (some color).
- Place of Publication:
- Hoboken : John Wiley and Sons Incorporated, 2013.
- System Details:
- text file
- Summary:
- "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"-- Provided by publisher.
- Notes:
- Includes bibliographical references and index.
- Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
- OCLC:
- 825819485
- Access Restriction:
- Restricted for use by site license.
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