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CIVEMSA 2014 : 2014 IEEE Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications : proceedings : May 5-7, 2014, University of Ottawa, Ottawa, Ontario, Canada / organized and sponsored by: IEEE, IEEE Instrumentation & Measurement Society, IEEE Computational Intelligence Society.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
University of Ottawa, host institution.
Institute of Electrical and Electronics Engineers, sponsoring body, organizer, publisher.
IEEE Instrumentation and Measurement Society, sponsoring body, organizer.
IEEE Computational Intelligence Society, sponsoring body, organizer.
Conference Name:
IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (2014 : Ottawa, Ont.)
Language:
English
Subjects (All):
Computational intelligence--Industrial applications--Congresses.
Computational intelligence.
Human-computer interaction--Congresses.
Human-computer interaction.
Virtual reality--Congresses.
Virtual reality.
Fuzzy systems--Congresses.
Fuzzy systems.
Measurement--Congresses.
Measurement.
Computational intelligence--Industrial applications.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (xi, 148 pages) : illustrations
Other Title:
2014 IEEE Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications
Available from some providers with title: Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA), 2014 IEEE International Conference on
2014 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA)
Also known as: IEEE CIVEMSA 2014
Place of Publication:
Piscataway, NJ : IEEE, [2014]
System Details:
text file
Notes:
"IEEE Catalog Number: CFP14CVA-CDR."
Includes bibliographical references and author index.
Description based on online resource; title from PDF cover page (IEEE Xplore, viewed October 17, 2014).
OCLC:
893190846
Access Restriction:
Restricted for use by site license.

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