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2013 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 13-17, 2013 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Integrated Reliability Workshop (2013 : South Lake Tahoe, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductors--Reliability--Congresses.
- Semiconductors.
- Integrated circuits--Wafer-scale integration--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Reliability--Congresses.
- Integrated circuits--Reliability.
- Integrated circuits--Wafer-scale integration--Reliability.
- Semiconductors--Reliability.
- Integrated circuits--Wafer-scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (various pagings) : illustrations
- Other Title:
- Available from some providers with title: Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
- IRW 2013
- Place of Publication:
- Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, [2013?]
- System Details:
- text file
- Notes:
- "IEEE Catalog Number CFP13IRW-PRT"
- Includes bibliographical references.
- Description based on online resource; title from PDF title page (IEEE Xplore, viewed Sept. 15, 2014).
- OCLC:
- 881404691
- Access Restriction:
- Restricted for use by site license.
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