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IPFA 2013 : proceedings of the 2013 20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits : 15-19 July, 2013, Shangri-La Hotel, Suzhou, China / edited by Mingxiang Wang ... [and others] ; sponsored by IEEE Nanjing Section ED/SSC Joint Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; organized by Soochow University, China .. [and others].

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Format:
Book
Conference/Event
Contributor:
Wang, Mingxiang.
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
Suzhou da xue.
IEEE Electron Devices Society.
IEEE Reliability Society.
Institute of Electrical and Electronics Engineers. Nanjing Section.
Conference Name:
International Symposium on the Physical & Failure Analysis of Integrated Circuits (20th : 2013 : Suzhou Shi, Jiangsu Sheng, China)
Language:
English
Subjects (All):
Integrated circuits--Reliability--Congresses.
Integrated circuits.
Integrated circuits--Testing--Congresses.
Semiconductors--Failures--Congresses.
Semiconductors.
Integrated circuits--Defects--Congresses.
Integrated circuits--Defects.
Integrated circuits--Reliability.
Integrated circuits--Testing.
Semiconductors--Failures.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (various pagings) : illustrations
Other Title:
Proceedings of the 2013 20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits
2013 20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits
20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits
International Symposium on the Physical & Failure Analysis of Integrated Circuits
Proceedings of the 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013)
Title on website landing page: Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Place of Publication:
Piscataway, NJ : IEEE, [2013]
System Details:
text file
Notes:
IEEE Catalogue Number: CFP13777-PRT.
Includes bibliographical references.
Title from title screen (IEEE Xplore, viewed Sep. 24, 2013).
OCLC:
860781317
Access Restriction:
Restricted for use by site license.

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