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2012 Future of Instrumentation International Workshop Proceedings : The Park Vista in Gatlinburg, Tennessee, October 8-9, 2012 : FIIW 2012 / Oak Ridge National Laboratory, IEEE.

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IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Oak Ridge National Laboratory, host institution.
Institute of Electrical and Electronics Engineers, host institution.
Conference Name:
Future of Instrumentation International Workshop (2012 : Gatlinburg, Tenn.), author.
Language:
English
Subjects (All):
Engineering instruments--Congresses.
Engineering instruments.
Detectors--Congresses.
Detectors.
Smart power grids--Congresses.
Smart power grids.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (142 pages) : illustrations
Other Title:
FIIW 2012
Title from HTML contents page: Future of Instrumentation International Workshop (FIIW), 2012
Place of Publication:
Piscataway, NJ : IEEE, 2012.
System Details:
text file
Notes:
"IEEE catalog number: CFP1247T-ART."
Includes bibliographical references and author index.
Description based on online resource; title from PDF front cover page (IEEE Xplore, viewed May. 29, 2013).
OCLC:
835861191
Access Restriction:
Restricted for use by site license.

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