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IEEE Autotestcon 2012 : September 10-13, 2012, Disneyland Resort Convention Center, Anaheim, California : proceedings.

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IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
Conference Name:
Autotestcon (2012 : Anaheim, Calif.)
Language:
English
Subjects (All):
Automatic test equipment--Congresses.
Automatic test equipment.
Maintainability (Engineering)--Congresses.
Maintainability (Engineering).
Testing--Data processing--Congresses.
Testing.
Testing--Data processing.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (xxxi, 364 pages) : illustrations
Other Title:
Autotestcon 2012
Available from some providers with title: Autotestcon, 2012 IEEE
2012 IEEE Autotestcon
Place of Publication:
Piscataway, N.J. : IEEE, [2012]
System Details:
text file
Notes:
"IEEE Catalog Number: CFP12AUT-CDR"
"Mission assurance through advanced ATE."
Includes bibliographical references and author index.
Description based on online resource; title from PDF cover page (IEEE Xplore, viewed on Dec. 17, 2012).
OCLC:
822216242
Access Restriction:
Restricted for use by site license.

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