2012 Workshop on Fault Diagnosis and Tolerance in Cryptography : FDTC 2012 : proceedings : 9 September 2012, Leuven, Belgium.

Format:

Book

Conference/Event

Contributor:

IEEE Xplore (Online service)

IEEE Computer Society, issuing body.

Conference Name:

Workshop on Fault Diagnosis and Tolerance in Cryptography (9th : 2012 : Leuven, Belgium)

Language:

English

Subjects (All):

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Cryptography--Congresses.

Cryptography.

Data encryption (Computer science)--Mathematical models--Congresses.

Data encryption (Computer science).

Mathematical models.

Genre:

Conference papers and proceedings.

Physical Description:

1 online resource (xi, 115 pages) : illustrations

Other Title:

FDTC 2012

Title on HTML contents screen: Fault Diagnosis and Tolerance in Cryptography (FDTC), 2012 Workshop on

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society, [2012]

System Details:

text file

Summary:

Researchers and engineers examine the effect of faults, either accidental or malicious, on integrated circuits that are implementing cryptographic algorithms. The invited papers discuss equipment, techniques, and experimental results for electromagnetic fault injection; and fault attacks on symmetric cryptography. Another 10 papers cover fault injection and simulation, differential fault analysis, fault analysis, and countermeasures. Among the topics are circuit simulation for fault sensitivity analysis and its application to cryptographic LSI, differential fault analysis on lightweight blockciphers with statistical cryptanalysis techniques, combined fault and side-channel attacks on the AES key schedule, the need for randomness in fault attack countermeasures, and random active shield. Annotation ©2012 Book News, Inc., Portland, OR (booknews.com)

Notes:

Includes bibliographical references and author index.

Title from PDF title page (IEEE Xplore, viewed on Jan. 22, 2013).

OCLC:

817932158

Access Restriction:

Restricted for use by site license.