2 options
Proceedings of the twentieth Asian Test Symposium : 20-23 November 2011, New Delhi, India.
- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium (20th : 2011 : New Delhi, India)
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Electronic circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Biographies.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- Test Symposium (ATS), 2011 20th Asian
- 2011 20th Asian Test Symposium (ATS)
- ATS 2011
- Place of Publication:
- Piscataway : IEEE, 2012.
- System Details:
- text file
- Notes:
- Includes bibliographical references and author index.
- Description based on online resource; title from PDF ot title page (IEEE Xplore, viewed Mar. 12, 2013).
- ISBN:
- 1457719843
- 9781457719844
- OCLC:
- 812660501
- Access Restriction:
- Restricted for use by site license.
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