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International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA / sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (41st : 2010 : Austin, Tex.)
- Language:
- English
- Subjects (All):
- Computer software--Testing--Congresses.
- Computer software.
- Computer software--Testing.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Radio frequency--Congresses.
- Radio frequency.
- Telecommunication--Congresses.
- Telecommunication.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Ebooks--UML.
- Integrated circuits--Testing.
- Local Subjects:
- Ebooks--UML.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- ITC 2010
- Available from some providers with title: Test Conference (ITC), 2010 IEEE International
- 2010 IEEE International Test Conference (ITC)
- Place of Publication:
- Piscataway, N.J. : IEEE ; Washington, D.C. : International Test Conference, [2010]
- System Details:
- text file
- Notes:
- "IEEE Catalog Number: CFP10ITC-CDR."
- Includes bibliographical references and author index.
- Online resource; title from title screen (IEEE Xplore, viewed Aug. 19, 2013).
- OCLC:
- 812633970
- Access Restriction:
- Restricted for use by site license.
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