My Account Log in

2 options

Annual Reliability and Maintainability Symposium 2010 proceedings : San Jose, California, USA, 2010 January 25-28.

Connect to full text Available online

View online

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

View online
Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
American Institute of Industrial Engineers.
Conference Name:
Reliability and Maintainability Symposium (2010 : San Jose, Calif.)
Language:
English
Subjects (All):
Reliability (Engineering)--Congresses.
Reliability (Engineering).
Maintainability (Engineering)--Congresses.
Maintainability (Engineering).
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource : illustrations
Other Title:
2010 Proceedings, Annual Reliability and Maintainability Symposium
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Reliability and Maintainability Symposium
RAMS 2010
Place of Publication:
Piscataway, N.J. : IEEE, [2010]
System Details:
text file
Notes:
Includes bibliographical references and index.
Description based on online resource; title from PDF title page (IEEE Xplore, viewed Feb. 2, 2013).
ISBN:
1424451027
9781424451029
9781424451036
1424451035
OCLC:
812622477
Access Restriction:
Restricted for use by site license.

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account