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2012 IEEE 30th VLSI Test Symposium : VTS 2012 : 23-26 April 2012, Hyatt Maui, Hawaii, USA : proceedings / [sponsored by IEEE Computer Society Test Technology Technical Council].
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- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (30th : 2012 : Maui, Hawaii)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- Available from some providers with title: VLSI Test Symposium (VTS), 2012 IEEE 30th
- VTS 2012
- Also known as: VTS12
- Place of Publication:
- [Piscataway, N.J.] : IEEE Computer Society, [2012]
- System Details:
- text file
- Notes:
- "IEEE Catalog Number: CFP12029-PRT"--PDF copyright page.
- Includes bibliographical references.
- Description based on online resource; title from PDF title page (IEEE Xplore, viewed June 10, 2013).
- OCLC:
- 812608157
- Access Restriction:
- Restricted for use by site license.
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