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DTIP 2012 : Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS : 25-26-27 April 2012, Cannes, Cote d'Azur, France.

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IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Society of Photo-Optical Instrumentation Engineers.
Institute of Electrical and Electronics Engineers.
Conference Name:
Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS (2012 : Cannes, France)
Language:
English
Subjects (All):
Microelectromechanical systems--Congresses.
Microelectromechanical systems.
Optoelectronic devices--Congresses.
Optoelectronic devices.
Micromachining--Congresses.
Micromachining.
Microelectronic packaging--Congresses.
Microelectronic packaging.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (xi, 259 pages) : illustrations
Other Title:
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
Title from HTML contents page: Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2012 Symposium on
2012 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)
Place of Publication:
[Piscataway, N.J.] : [IEEE], [2012]
System Details:
text file
Notes:
Joint meeting of CAD, Design and Test Conference and Microfabrication, Integration and Packaging Conference.
Description based on online resource; title from PDF front cover (IEEE Xplore, viewed Feb. 4, 2013).
Includes bibliographical references and author index.
OCLC:
812607842
Access Restriction:
Restricted for use by site license.

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