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Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : April 18-20, 2012, Tallinn, Estonia.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Conference Name:
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (15th : 2012 : Tallinn, Estonia)
Language:
English
Subjects (All):
Integrated circuits--Testing--Congresses.
Integrated circuits.
Integrated circuits--Design and construction--Congresses.
Integrated circuits--Design and construction.
Integrated circuits--Testing.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (386 pages) : illustrations
Other Title:
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
DDECS
2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 18-20, 2012, Tallinn, Estonia
Place of Publication:
Piscataway, NJ : IEEE, 2012.
System Details:
text file
Notes:
"IEEE Catalog Number: CFP12DDE-PRT."
Includes bibliographical references and index.
Description based on online resource; title from PDF title page (IEEE Xplore, viewed Feb. 1, 2013).
OCLC:
812607838
Access Restriction:
Restricted for use by site license.

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