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Proceedings, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : DFT 2011 : 3-5 October 2011, Vancouver, B.C. Canada.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (2011 : Vancouver, B.C.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction.
- Integrated circuits--Fault tolerance--Congresses.
- Integrated circuits--Fault tolerance.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Defect and fault tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
- DFT 2011
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2011]
- System Details:
- text file
- Summary:
- The conferences concentrate on research into the occurrence of defects in VLSI, MENS, and nano-circuits and into developing ways of compensating or avoiding these errors to keep devices working. The 57 papers from this year's convening consider such areas as soft errors, diagnosis and low-power tests, the fault tolerant design of power systems, and techniques and tools for supporting dependable design. Among specific topics are a new algorithm for post-silicon clock measurement and tuning, a schematic-based extraction methodology for dislocation defects in analog/mixed-signal devices, modeling gate delay faults by means of transition delay faults, and predicting pixel defect rates based on image sensor parameters. Only the authors are indexed. Annotation ©2011 Book News, Inc., Portland, OR (booknews.com)
- Notes:
- CFP11078-PRT
- Includes bibliographical references and author index.
- Description based on online resource; title from PDF home page (IEEE Xplore, viewed July 7, 2013).
- ISBN:
- 9780769545561
- 0769545564
- OCLC:
- 812606343
- Access Restriction:
- Restricted for use by site license.
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