2 options
Twenty Sixth Annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 2010 : : Santa Clara, CA USA, Feb. 21-25, 2010 / IEEE, IEEE Components, Packaging and Manufacturing Technology Society [and] NIST National Institute of Standards and Technology.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Semiconductor Thermal Measurement and Management Symposium (26th : 2010 : Santa Clara, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductors--Thermal properties--Congresses.
- Semiconductors.
- Semiconductors--Cooling--Congresses.
- Semiconductors--Cooling.
- Semiconductors--Thermal properties.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- Available from some providers with title: Semiconductor Thermal Measurement and Management Symposium, 2010, SEMI-THERM 2010, 26th Annual IEEE : Date: 21-25 Feb. 2010
- SEMI-THERM 2010
- 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2010
- Place of Publication:
- Piscataway, NJ : IEEE, 2010.
- System Details:
- text file
- Notes:
- Includes bibliographical references.
- Description based on online resource; title from PDF cover page (IEEE Xplore, viewed Jan. 21, 2013).
- OCLC:
- 812592093
- Access Restriction:
- Restricted for use by site license.
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