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2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL / sponsored by the IEEE Electron Devices Society.
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- Book
- Conference/Event
- Conference Name:
- IEEE International Conference on Microelectronic Test Structures (2011 : Amsterdam, Netherlands)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Electronic apparatus and appliances--Testing.
- Integrated circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 24th ICMTS Conference proceedings
- Available from some providers with title: Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on
- Place of Publication:
- [Piscataway, N.J.] : IEEE, [2011]
- System Details:
- text file
- Notes:
- Includes bibliographical references.
- Description based on online resource; title from PDF title page (IEEE Xplore, viewed May 16, 2012).
- ISBN:
- 9781424485284
- 1424485282
- OCLC:
- 793803210
- Access Restriction:
- Restricted for use by site license.
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