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2011 29th IEEE VLSI Test Symposium : proceedings : VTS 2011 : 1-5 May 2011, Dana Point, CA, USA / [sponsored by IEEE Computer Society Test Technology Technical Council].
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View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (29th : 2011 : Dana Point, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- VTS 2011
- Available from some providers with title: VLSI Test Symposium (VTS), 2011 IEEE 29th
- Place of Publication:
- [Piscataway, N.J.] : IEEE Computer Society, [2011]
- System Details:
- text file
- Notes:
- Includes bibliographical references and index.
- Description based on online resource; title from PDF title page (IEEE Xplore, viewed Mar. 19, 2012).
- OCLC:
- 780454103
- Access Restriction:
- Restricted for use by site license.
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