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Applied Imagery Pattern Recognition Workshop (AIPR), 2010 IEEE 39th : date, 13-15 Oct. 2010.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Applied Imagery Pattern Recognition Workshop (39th : 2010 : Washington, D.C.)
- Language:
- English
- Subjects (All):
- Optical pattern recognition--Congresses.
- Optical pattern recognition.
- Pattern recognition systems--Congresses.
- Pattern recognition systems.
- Image processing--Digital techniques--Congresses.
- Image processing.
- Image processing--Digital techniques.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations (some color)
- Other Title:
- 2010 IEEE 39th Applied Imagery Pattern Recognition Workshop (AIPR)
- AIPR 2010
- Place of Publication:
- [Piscataway, N.J.] : [IEEE], [2010]
- System Details:
- text file
- Notes:
- Includes bibliographical references.
- Description based on online resource; title from HTML contents page (IEEE Xplore, viewed Jan. 6, 2012).
- OCLC:
- 771152397
- Access Restriction:
- Restricted for use by site license.
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