IEEE standard for artificial intelligence exchange and service tie to all test environments (AI-ESTATE) / sponsor, IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.

Format:

Book

Contributor:

IEEE Xplore (Online service)

Institute of Electrical and Electronics Engineers.

IEEE-SA Standards Board.

Series:

IEEE Std

Language:

English

Subjects (All):

Artificial intelligence--Standards.

Artificial intelligence.

Expert systems (Computer science)--Standards.

Expert systems (Computer science).

Physical Description:

1 online resource (viii, 158 pages) : illustrations

Other Title:

IEEE Std 1232-2010 (Revision of IEEE Std 1232-2002)

Place of Publication:

New York : Institute of Electrical and Electronics Engineers, 2011.

System Details:

text file

Summary:

Abstract: Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and Service Tie to All Test Environments (AIESTATE). The purpose of AI-ESTATE is to standardize interfaces for functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners and also to provide a formal typing system for diagnostic services. The services to control a diagnostic reasoned are defined by this standard. Keywords: AI-ESTATE, Bayesian Network, diagnosis, diagnostic inference, diagnostic model, diagnostic services, D-matrix, fault tree, IEEE 1232, knowledge exchange, system test.

Notes:

"IEEE Std 1232-2010 (Revision of IEEE Std 1232-2002)."

"Approved 8 December 2010, IEEE-SA Standards Board."

"Published 25 March 2011 ; STD97065, STDPD97065"--P. [ii].

Title from title page (viewed June 13, 2011).

Includes bibliographical references (pages 136-137).

Other Format:

Print version: IEEE standard for artificial intelligence exchange and service tie to all test environments (AI-ESTATE).

ISBN:

9780738165257

0738165255

OCLC:

730257459

Access Restriction:

Restricted for use by site license.