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Proceedings : 2009 Asian Test Symposium : ATS 2009 : 23-26 November, 2009, Taichung, Taiwan / [sponsored by IEEE Computer Society Test Technology Council].
- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium (18th : 2009 : Tʻai-chung shih, Taiwan)
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Electronic circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (xxv, 465 pages) : illustrations
- Other Title:
- 18th Asian Test Symposium
- Asian Test Symposium
- ATS 2009
- Available from some providers with title: Asian Test Symposium, 2009. ATS '09
- ATS '09
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2009]
- System Details:
- text file
- Notes:
- Includes bibliographical references and author index.
- "IEEE Computer Society Order Number P3864"--T.p. verso.
- Description based on print version record.
- Other Format:
- Print version: Asian Test Symposium (18th : 2009 : Taichung, Taiwan). Proceedings.
- OCLC:
- 645300090
- Access Restriction:
- Restricted for use by site license.
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