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International Test Conference 2009 : proceedings : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (40th : 2009 : Austin, Tex.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Integrated circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- ITC 2009
- Available from some providers with title: Test Conference, 2009. ITC 2009. International
- Place of Publication:
- Washington, D.C. : International Test Conference, [2009]
- System Details:
- text file
- Notes:
- Title from PDF cover (IEEE Xplore, viewed on Apr. 20, 2010).
- Includes bibliographical references and index.
- IEEE catalog number: CFP09ITC-CDR.
- OCLC:
- 608065487
- Access Restriction:
- Restricted for use by site license.
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