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The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings, Chicago, Illinois, 7-9 October 2009 / sponsored by the IEEE Computer Society Technical Committee on Fault Tolerant Computing, the IEEE Computer Society Test Technology Technical Committee Council ; edited by Dimitris Gizopoulos, Mohammad Tehranipoor, Spyros Tragoudas.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2009 : Chicago, Ill.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (xxxi, 455 pages) : illustrations
- Other Title:
- Defect and Fault Tolerance in VLSI Systems
- 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
- DFT 2009
- DFT '09
- Available from some providers with title: Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [2009]
- System Details:
- text file
- Notes:
- Includes bibliographical references and author index.
- "IEEE Computer Society Press Order Number P3839 "--T.p. verso.
- Description based on print version record.
- Other Format:
- Print version: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2009 : Chicago, Ill.). IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems.
- OCLC:
- 586097872
- Access Restriction:
- Restricted for use by site license.
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