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The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings, Chicago, Illinois, 7-9 October 2009 / sponsored by the IEEE Computer Society Technical Committee on Fault Tolerant Computing, the IEEE Computer Society Test Technology Technical Committee Council ; edited by Dimitris Gizopoulos, Mohammad Tehranipoor, Spyros Tragoudas.

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Format:
Book
Conference/Event
Contributor:
Gizopoulos, Dimitris.
Tehranipoor, Mohammad H., 1974-
Tragoudas, Spyros.
IEEE Xplore (Online service)
IEEE Computer Society. Test Technology Technical Committee.
IEEE Computer Society. Fault-Tolerant Computing Technical Committee.
IEEE Computer Society.
Conference Name:
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2009 : Chicago, Ill.)
Language:
English
Subjects (All):
Integrated circuits--Very large scale integration--Design and construction--Congresses.
Integrated circuits.
Integrated circuits--Very large scale integration--Design and construction.
Fault-tolerant computing--Congresses.
Fault-tolerant computing.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (xxxi, 455 pages) : illustrations
Other Title:
Defect and Fault Tolerance in VLSI Systems
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
DFT 2009
DFT '09
Available from some providers with title: Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Place of Publication:
Los Alamitos, Calif. : IEEE Computer Society Press, [2009]
System Details:
text file
Notes:
Includes bibliographical references and author index.
"IEEE Computer Society Press Order Number P3839 "--T.p. verso.
Description based on print version record.
Other Format:
Print version: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2009 : Chicago, Ill.). IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems.
OCLC:
586097872
Access Restriction:
Restricted for use by site license.

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