2008 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 12-16, 2008 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

Format:

• Book
• Conference/Event

Contributor:

• IEEE Xplore (Online service)
• IEEE Electron Devices Society.
• IEEE Reliability Society.

Conference Name:

• International Integrated Reliability Workshop (2008 : South Lake Tahoe, Calif.)

Language:

English

Subjects (All):

• Integrated circuits--Reliability--Congresses.
• Integrated circuits--Wafer-scale integration--Reliability--Congresses.
• Integrated circuits--Reliability.
• Integrated circuits--Wafer-scale integration--Reliability.
• Integrated circuits--Wafer-scale integration.

Genre:

• Conference papers and proceedings.

Physical Description:

1 online resource : illustrations

Other Title:

• IRW 2008 final report CD
• Available from some providers with title: Integrated Reliability Workshop Final Report, 2008, IRW 2008, IEEE International
• IEEE International Integrated Reliability Workshop Final Report, 2008

Place of Publication:

[Piscataway, N.J.?] : Electron Devices Society : Reliability Society, [2008]

System Details:

text file

Notes:

• Title from PDF t.p. (IEEE Xplore, viewed Jan. 6, 2010).
• Includes bibliographical references.
• IEEE catalog no: CFP08IRW.

Other Format:

CD-ROM version: 2008 IEEE International Integrated Reliability Workshop (Irw).

OCLC:

496175991

Access Restriction:

Restricted for use by site license.