2 options
2008 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 12-16, 2008 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- International Integrated Reliability Workshop (2008 : South Lake Tahoe, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Wafer-scale integration--Reliability--Congresses.
- Integrated circuits--Reliability.
- Integrated circuits--Wafer-scale integration--Reliability.
- Integrated circuits--Wafer-scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- IRW 2008 final report CD
- Available from some providers with title: Integrated Reliability Workshop Final Report, 2008, IRW 2008, IEEE International
- IEEE International Integrated Reliability Workshop Final Report, 2008
- Place of Publication:
- [Piscataway, N.J.?] : Electron Devices Society : Reliability Society, [2008]
- System Details:
- text file
- Notes:
- Title from PDF t.p. (IEEE Xplore, viewed Jan. 6, 2010).
- Includes bibliographical references.
- IEEE catalog no: CFP08IRW.
- Other Format:
- CD-ROM version: 2008 IEEE International Integrated Reliability Workshop (Irw).
- OCLC:
- 496175991
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.