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Twenty Fifth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2009, San Jose, CA USA, March 15-19, 2009 / IEEE, IEEE Components and Manufacturing Technology Society and NIST National Institute of Standards and Technology.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Semiconductor Thermal Measurement and Management Symposium (25th : 2009 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductors--Thermal properties--Congresses.
- Semiconductors.
- Semiconductors--Cooling--Congresses.
- Semiconductors--Cooling.
- Semiconductors--Thermal properties.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
- 25th IEEE SEMI-THERM Symposium
- SEMI-THERM 2009
- 2009 PROCEEDINGS, Twenty Fifth IEEE Semiconductor Thermal Measurement and Management Symposium
- Variant title from electronic version: Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
- Place of Publication:
- [Piscataway, N.J.] : IEEE Xplore, [2009]
- System Details:
- text file
- Notes:
- Title from PDF cover (IEEE Xplore, viewed on Jan. 4, 2010).
- Includes bibliographical references.
- ISBN:
- 9781424436644
- 1424436648
- OCLC:
- 495724502
- Access Restriction:
- Restricted for use by site license.
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