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2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA : VTS 2009 / [sponsored by] IEEE Computer Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (27th : 2009 : Santa Cruz, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (xxvii, 341 pages) : illustrations
- Other Title:
- 27th IEEE VLSI Test Symposium
- Available from some providers with title: VLSI Test Symposium, 2009, VTS '09, 27th IEEE
- VTS 2009
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2009]
- System Details:
- text file
- Notes:
- "IEEE Computer Society Order Number P3598"--T.p. verso.
- "BMS part no. CFP09029PRT"--T.p. verso.
- Includes bibliographical references and index.
- Description based on print version record.
- Other Format:
- Print version: IEEE VLSI Test Symposium (27th : 2009 : Santa Cruz, Calif.). 2009 27th IEEE VLSI Test Symposium.
- OCLC:
- 461735447
- Access Restriction:
- Restricted for use by site license.
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