The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings, Boston, Massachusetts, 1-3 October 2008 / sponsored by the IEEE Computer Society Test Technology Technical Committee Council, the IEEE Computer Society Technical Committee on Fault Tolerant Computing ; edited by Cristiana Bolchini ... [and others].

Format:

Book

Conference/Event

Contributor:

Bolchini, Cristiana.

IEEE Xplore (Online service)

IEEE Computer Society. Test Technology Technical Committee.

IEEE Computer Society. Fault-Tolerant Computing Technical Committee.

IEEE Computer Society.

Conference Name:

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2008 : Boston, Mass.)

Language:

English

Subjects (All):

Integrated circuits--Very large scale integration--Design and construction--Congresses.

Integrated circuits.

Integrated circuits--Very large scale integration--Design and construction.

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Genre:

Conference papers and proceedings.

Physical Description:

1 online resource (xxxi, 545 pages) : illustrations

Other Title:

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Defect and fault tolerance in VLSI systems

DFT 2008

Available from some providers with title: Defect and Fault Tolerance of VLSI Systems, 2008, DFTVS '08, IEEE International Symposium on

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society Press, [2008]

System Details:

text file

Notes:

"IEEE Computer Society Press Order Number P3365 "--T.p. verso.

Includes bibliographical references and author index.

Description based on print version record.

Other Format:

Print version: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2008 : Boston, Mass.). 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems.

OCLC:

425967000

Access Restriction:

Restricted for use by site license.