Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 15-17, 2009, Liberec, Czech Republic / sponsored by IEEE Computer Society, Test Technology Technical Council ; in cooperation with Institute of Information Technology and Electronics of Technical University of Liberec ; [editors, Michel Renovell ... [and others].

Format:

Book

Conference/Event

Contributor:

Renovell, M. (Michel)

IEEE Xplore (Online service)

IEEE Computer Society. Technical Council on Test Technology.

Technická univerzita v Liberci. Institute of Information Technology and Electronics.

Conference Name:

IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (2009 : Liberec, Czech Republic)

Language:

English

Subjects (All):

Integrated circuits--Testing--Congresses.

Integrated circuits.

Integrated circuits--Design--Congresses.

Integrated circuits--Design.

Integrated circuits--Testing.

Genre:

Conference papers and proceedings.

Physical Description:

1 online resource : illustrations

Other Title:

2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems

DDECS 2009

From foreword, called: 12th IEEE DDECS Symposium

Available from some providers with title: Design and Diagnostics of Electronic Circuits & Systems, 2009, DDECS '09 12th International Symposium on

12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2009

Place of Publication:

[Piscataway, N.J.] : IEEE, [2009]

System Details:

text file

Notes:

Title from PDF title page (IEEE Xplore, viewed on June 24, 2009).

Includes bibliographical references and author index.

Other Format:

Print version:

ISBN:

9781424433414

142443341X

OCLC:

407130839

Access Restriction:

Restricted for use by site license.