My Account Log in

2 options

MTV 2007 : Eighth International Workshop on Microprocessor Test and Verification : proceedings, 5-6 December, 2007, Austin. Texas, USA / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ... [and others].

Connect to full text Available online

View online

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

View online
Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
IEEE Computer Society. Technical Council on Test Technology.
Conference Name:
International Workshop on Microprocessor Test and Verification (8th : 2007 : Austin, Tex.)
Language:
English
Subjects (All):
Microprocessors--Testing--Congresses.
Microprocessors.
Integrated circuits--Testing--Congresses.
Integrated circuits.
Integrated circuits--Verification--Congresses.
Integrated circuits--Verification.
Systems on a chip--Testing--Congresses.
Systems on a chip.
Testing.
Microprocessors--Testing.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (x, 137 pages) : illustrations
Other Title:
Eighth International Workshop on Microprocessor Test and Verification
Proceedings, Eigth International Workshop on Microprocessor Test and Verification : MTV 2007
Microprocessor Test and Verification
Available from some providers with title: Microprocessor Test and Verification, 2007, MTV '07, Eighth International Workshop on
Place of Publication:
Los Alamitos, Calif. : IEEE Computer Society, [2008]
System Details:
text file
Notes:
"Common Challenges and Solutions"--Cover.
"IEEE Computer Society Order Number P3241"--T.p. verso.
Includes bibliographical references and author index.
Description based on print version record.
Other Format:
Print version: International Workshop on Microprocessor Test and Verification (8th : 2007 : Austin, Tex.) MTV 2007.
OCLC:
325680225
Access Restriction:
Restricted for use by site license.

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account