Proceedings of the 2007 Applied Imagery and Pattern Recognition Workshop : Cosmo Club, Washington DC, October 10-12, 2007 / sponsored by the Institute of Electrical and Electronics Engineers (IEEE), Science Applications International Corporation (SAIC).

Format:

Book

Conference/Event

Contributor:

IEEE Xplore (Online service)

Institute of Electrical and Electronics Engineers.

Science Applications International Corporation.

Conference Name:

Applied Imagery Pattern Recognition Workshop (36th : 2007 : Washington, D.C.)

Language:

English

Subjects (All):

Optical pattern recognition--Congresses.

Optical pattern recognition.

Pattern recognition systems--Congresses.

Pattern recognition systems.

Image processing--Digital techniques--Congresses.

Image processing.

Image processing--Digital techniques.

Genre:

Conference papers and proceedings.

Physical Description:

1 online resource (vii, 145 pages) : illustrations

Other Title:

2007 Applied Imagery and Pattern Recognition Workshop

Designing to see vs. learning to see : comparing analytical and adaptive methods

Title from Digital Object Identifier: AIPR 2007

Available from some providers with title: Applied Imagery Pattern Recognition Workshop, 2007, AIPR 2007, 36th IEEE

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society, [2008]

System Details:

text file

Notes:

Title from PDF title page (IEEE Xplore, viewed Aug. 31, 2009).

Includes bibliographical references and author index.

IEEE Computer Society order number E3066.

OCLC:

276948463

Access Restriction:

Restricted for use by site license.