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Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis : CMD 2008, Beijing, China, April 21-24, 2008 / sponsored by IEEE [and others] ; organized by Beijing Area Major Laboratory of High Voltage & EMC, North China Electric Power University.

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IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
Hua bei dian li da xue. Beijing Area Major Laboratory of High Voltage and EMC.
Conference Name:
International Conference on Condition Monitoring and Diagnosis (2008 : Beijing, China)
Language:
English
Subjects (All):
Electric machinery--Testing--Congresses.
Electric machinery.
Electric machinery--Reliability--Congresses.
Electric machinery--Monitoring--Congresses.
Electric machinery--Monitoring.
Electric machinery--Reliability.
Electric machinery--Testing.
Genre:
Conference papers and proceedings.
Physical Description:
1 online resource (1 volume)
Other Title:
CMD 2008
2008 International Conference on Condition Monitoring and Diagnosis, Beijing, China, April 21-24, 2008
IEEE Xplore title: Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
Place of Publication:
[Piscataway, N.J.] : IEEE, 2008.
System Details:
text file
Notes:
Title from cover pdf file (viewed Aug. 18, 2008).
IEEE Catalog Number: CFP0830D-PRT.
Includes bibliographical references and index.
OCLC:
244003510
Access Restriction:
Restricted for use by site license.

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