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VLSI Design, Automation and Test, 2008, VLSI-DAT 2008, IEEE International Symposium on : date, 23-25 April, 2008.
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- Book
- Conference/Event
- Conference Name:
- International Symposium on VLSI Design, Automation, and Test (2008 : Hsin-chu shih, Taiwan)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource
- Other Title:
- VLSI-DAT 2008
- Place of Publication:
- [Piscataway, N.J.] : IEEE Xplore, [2008]
- System Details:
- text file
- Notes:
- Title from HTML table of contents (viewed June 25, 2008).
- "IEEE catalog number: CFP08847"--PDF copyright page.
- Includes bibliographical references.
- "The 2008 International Symposium on VLSI Design, Automation, and Test (2008 VLSI-DAT) organized by the Industrial Technology Research Institute of Taiwan, will take place in Hsinchu, Taiwan on April 23-25, 2008"--Foreword.
- ISBN:
- 9781424416165
- 1424416167
- OCLC:
- 232608435
- Access Restriction:
- Restricted for use by site license.
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