Advanced Transmission Electron Microscopy : Applications for Nanomaterials / edited by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal.

Format:

• Book

Contributor:

• Deepak, Francis Leonard, editor.
• Mayoral, Alvaro, editor.
• Arenal, Raul, editor.

Language:

English

Subjects (All):

• Transmission electron microscopy.
• Nanostructured materials--Nondestructive testing.
• Nanostructured materials.
• Nondestructive testing.

Physical Description:

xii, 272 pages : illustrations (some color) ; 24 cm

Place of Publication:

[Place of publication not identified] : Cham : Springer, 2015.

Contents:

• Preface
• Introduction to TEM, HRTEM and aberration corrected microscopy
• Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy
• Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles
• Zeolites and Ordered Mesoporous materials under the electron microscope
• Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials
• 3D-nanometric analyses via electron tomography: application to nanomaterials
• In situ TEM of carbon nanotubes
• Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.

Notes:

Includes bibliographical references and index.

ISBN:

• 9783319151762
• 3319151762

OCLC:

898531806