Trace characterization, chemical and physical. / W. Wayne Meinke and Bourdon F. Scribner, editors [from the] Institute for Materials Research.

Format:

Book

Conference/Event

Contributor:

Meinke, W. Wayne, editor.

Scribner, Bourdon F. (Bourdon Francis), 1910-2007, editor.

Institute for Materials Research (U.S.)

Conference Name:

Materials Research Symposium. 1st, 1966, Gaithersburg, Md.

Series:

NBS monograph ; 100.

National Bureau of Standards monograph 100.

Language:

English

Subjects (All):

Analytical chemistry--Congresses.

Analytical chemistry.

Genre:

Conference papers and proceedings.

Physical Description:

xiii, 580 pages : illustrations ; 25 cm.

Place of Publication:

[Washington] : Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1967.

Notes:

"Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966.".

Includes bibliographies.

OCLC:

425883