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VLSI testing / edited by T.W. Williams.
LIBRA TK7874 .V5666 1986
Available from offsite location
- Format:
- Book
- Series:
- Advances in CAD for VLSI ; v. 5.
- Advances in CAD for VLSI ; v. 5
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing.
- Integrated circuits.
- Physical Description:
- ix, 275 pages : illustrations ; 25 cm.
- Place of Publication:
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- Notes:
- Includes bibliographies.
- ISBN:
- 0444878955
- OCLC:
- 13270651
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