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Atomic force microscopy : understanding basic modes and advanced applications / Greg Haugstad.
- Format:
- Book
- Author/Creator:
- Haugstad, Greg, 1963-
- Language:
- English
- Subjects (All):
- Atomic force microscopy.
- Physical Description:
- 1 online resource (xxii, 464 pages) : illustrations
- Place of Publication:
- Hoboken, N.J. : John Wiley & Sons, [2012]
- System Details:
- text file
- Summary:
- Atomic force microscopy has become an essential tool for materials and biological research, says Haugstad (characterization, U. of Minnesota), but rigorous education and training in it is lacking and even experienced users tend not to exchange information with others or newcomers. Drawing material from a number of curricular course, training sessions, short courses, and outreach programs, he offers a tutorial for prospective users of the imaging technology from pre-college students to working scientists. The topics include distance-dependent interactions, topographic imaging, probing material properties, data post-processing and statistical analysis, and advanced dynamic force methods. Annotation ©2012 Book News, Inc., Portland, OR (booknews.com)
- Notes:
- Description based on print version record.
- Includes bibliographical references and index.
- Electronic reproduction. Hoboken, N.J. Available via World Wide Web.
- Local Notes:
- Acquired for the Penn Libraries with assistance from the Anne and Joseph Trachtman Memorial Book Fund.
- ISBN:
- 1118360699
- 9781118360699
- Publisher Number:
- 99951704819
- Access Restriction:
- Restricted for use by site license.
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