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Yield simulation for integrated circuits / by Duncan Moore Henry Walker.
LIBRA TK7874 .W34 1987
Available from offsite location
- Format:
- Book
- Author/Creator:
- Walker, Duncan Moore Henry.
- Series:
- Kluwer international series in engineering and computer science. VLSI, compter architecture, and digital signal processing.
- The Kluwer international series in engineering and computer science. VLSI, compter architecture, and digital signal processing
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Design and construction--Mathematical models.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction--Data processing.
- Integrated circuits--Very large scale integration--Defects--Mathematical models.
- Integrated circuits--Very large scale integration--Defects--Data processing.
- Monte Carlo method.
- Integrated circuits--Very large scale integration--Defects.
- Integrated circuits--Very large scale integration.
- Integrated circuits--Very large scale integration--Design and construction.
- Physical Description:
- x, 209 pages : illustrations ; 25 cm.
- Place of Publication:
- Boston : Kluwer Academic Publishers, [1987]
- Notes:
- Based on author's thesis (Ph. D.).
- Includes index.
- Bibliography: pages [189]-206.
- ISBN:
- 0898382440
- OCLC:
- 16224692
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