Surface and thin film analysis : a compendium of principles, instrumentation, and applications / edited by Gernot Friedbacher and Henning Bubert.

Format:

Book

Contributor:

Friedbacher, Gernot.

Bubert, H. (Henning)

Language:

English

Subjects (All):

Thin films--Surfaces--Analysis.

Thin films.

Thin films--Surfaces.

Physical Description:

xxiv, 533 pages : illustrations ; 25 cm

Edition:

Second, completely revised and enlarged edition.

Place of Publication:

Weinheim, Germany : Wiley-VCH, 2011.

Summary:

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP), and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett)..". a useful resource..."(Journal of the American Chemical Society)

Notes:

Includes bibliographical references and index.

ISBN:

9783527320479

3527320474

OCLC:

694394248