Fabrication and characterization in the micro-nano range : new trends for two and three dimensional structures / Fernando A. Lasagni, Andrés F. Lasagni, editors.

Format:

Book

Contributor:

Lasagni, Fernando A.

Lasagni, Andrés F.

Series:

Advanced structured materials ; 10.

Advanced structured materials

Language:

English

Subjects (All):

Nanostructured materials.

Physical Description:

x, 222 pages : illustrations (some color) ; 25 cm.

Place of Publication:

Heidelberg ; London : Springer, [2011]

Summary:

This book shows an update in the field of micro/nano fabrications techniques of two and three dimensional structures as well as ultimate three dimensional characterization methods from the atom range to the micro scale. Several examples are presented showing their direct application in different technological fields such as microfluidics, photonics, biotechnology and aerospace engineering, between others. The effects of the microstructure and topography on the macroscopic properties of the studied materials are discussed, together with a detailed review of 3D imaging techniques. Book jacket.

Contents:

Exploring the Possibilities of Laser Interference Patterning for the rapid Fabrication of Periodic Arrays on Macroscopic Areas / Andrés Fabián Lasagni Lasagni, Andrés Fabián 1

Laser Micromachining / Udo Klotzbach Klotzbach, Udo, Andrés Fabián Lasagni Lasagni, Andrés Fabián, Michael Panzner Panzner, Michael, Volker Franke Franke, Volker 29

Patterning and Optical Properties of Materials at the Nanoscale / Noemí Pérez Pérez, Noemí, Ainana Rodríguez Rodríguez, Ainana, Santiago M. Olaizola Olaizola, Santiago M. 47

Ion Beam Sputtering: A Route for Fabrication of Highly Ordered Nanopatterns / Marina Cornejo Cornejo, Marina, Jens Völlner Völlner, Jens, Bashkim Ziberi Ziberi, Bashkim, Frank Frost Frost, Frank, Bernd Rauschenbach Rauschenbach, Bernd 69

Three-Dimensional Open Cell Structures: Evaluation and Fabrication by Additive Manufacturing / Jürgen Stampfl Stampfl, Jürgen, Heinz E. Pettermann Pettermann, Heinz E., Mathias H. Luxner Luxner, Mathias H. 95

X-ray Microtomography: Characterisation of Structures and Defect Analysis / Bernhard Harrer Harrer, Bernhard, Johann Kastner Kastner, Johann 119

Submicron Tomography Using High Energy Synchrotron Radiation / András Borbély Borbély, András, Peter Cloetens Cloetens, Peter, Eric Maire Maire, Eric, Guillermo Requena Requena, Guillermo 151

Nano Characterization of Structures by Focused Ion Beam (FIB) Tomography / Flavio Andrés Soldera Soldera, Flavio Andrés, Fernando Adrián Lasagni Lasagni, Fernando Adrián, Frank Mücklich Mücklich, Frank 171

Atom Probe Tomography: 3D Imaging at the Atomic Level / D. Blavette Blavette, D., F. Vurpillot Vurpillot, F., B. Deconihout Deconihout, B., A. Menand Menand, A. 201.

Notes:

Includes bibliographical references.

ISBN:

3642177816

9783642177811

OCLC:

703548430