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Digest of papers: Testing to integrate semiconductor memories into computer mainframes. / Sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute for Electrical and Electronics Engineers.
LIBRA TK7895.M4 S96 1972
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- Semiconductor Memory Test Symposium, Cherry, N. J., 1972.
- Language:
- English
- Subjects (All):
- Computer storage devices--Testing--Congresses.
- Computer storage devices.
- Semiconductors--Reliability--Congresses.
- Semiconductors.
- Semiconductors--Reliability.
- Congresses and conventions.
- Computer storage devices--Testing.
- Physical Description:
- 96 pages : illustrations ; 28cm
- Other Title:
- Testing to integrate semiconductor memories into computer mainframes.
- Place of Publication:
- New York : Institute of Electrical and Electronics Engineers; available from: IEEE Computer Society, Northridge, Calif., [1973]
- Notes:
- Cover title: IEEE 1972 semiconductor memories computer mainframes.
- Includes bibliographical references.
- OCLC:
- 51396976
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