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Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / [edited by] W. Richard Bowen and Nidal Hilal.

Van Pelt Library QH212.A78 B69 2009
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Format:
Book
Contributor:
Bowen, W. Richard.
Hilal, Nidal
Alumni and Friends Memorial Book Fund.
Language:
English
Subjects (All):
Atomic force microscopy.
Production engineering.
Physical Description:
xvi, 283 pages : illustrations ; 24 cm
Edition:
First edition.
Place of Publication:
Burlington, Mass. : Butterworth-Heinemann, 2009.
Notes:
Includes bibliographical references (pages 270-274) and index.
Local Notes:
Acquired for the Penn Libraries with assistance from the Alumni and Friends Memorial Book Fund.
ISBN:
9781856175173
1856175170
OCLC:
311788904
Publisher Number:
99937076921

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